Paper
2 February 2009 Dual-frequency green laser interferometer based on a frequency stabilized 543.5nm Zeeman He-Ne laser
Jing Lei, Juqun Yan, Nanhai Song
Author Affiliations +
Abstract
A dual-frequency laser interferometer is established based on a frequency-stabilized 543.5nm Zeeman He-Ne laser. The interferometer has been tested in displacement measuring experiments in comparison with a commercial 632.8nm dualfrequency laser interferometer. Test results show that the achieved stability and the accuracy of the dual-frequency green laser interferometer have reached the level in commercial dual-frequency interferometers. Apart from being capable in heterodyne interferometry as a single-wavelength interferometer, the 543.5nm dual-frequency interferometer is also promising in two-wavelength interferometry when combined with the commercial 632.8nm dual-frequency interferometer, where both a high resolution and a relatively large range in displacement measurement can be achieved.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jing Lei, Juqun Yan, and Nanhai Song "Dual-frequency green laser interferometer based on a frequency stabilized 543.5nm Zeeman He-Ne laser", Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71601T (2 February 2009); https://doi.org/10.1117/12.806697
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Cited by 1 scholarly publication.
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KEYWORDS
Interferometers

Laser stabilization

Helium neon lasers

Interferometry

Magnetism

Heterodyning

Refractive index

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