Thickness and index measurements of a transparent specimen by full-field optical coherence microscopy

Jihoon Na; Woo June Choi; Hae Young Choi; Seon Young Ryu; Eun Seo Choi; Byeong Ha Lee

doi:10.1117/12.808971

3 March 2009 Thickness and index measurements of a transparent specimen by full-field optical coherence microscopy

Jihoon Na, Woo June Choi, Hae Young Choi, Seon Young Ryu, Eun Seo Choi, Byeong Ha Lee

Proceedings Volume 7184, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVI; 71841B (2009) https://doi.org/10.1117/12.808971
Event: SPIE BiOS, 2009, San Jose, California, United States

Abstract

We present the method measuring the thickness and the refractive index of a transparent specimen at a same time based on full-field optical coherence tomography. As a sample a small drop of epoxy was placed on a flat plate and the high-resolution depth resolved en-face images of the epoxy drop were taken. With adopting the plate surface as a reference plane, the physical thickness and the refractive index distribution could be obtained. Owing to the full-field imaging capability, we could obtain the transverse distributions of the thickness and the refractive index without any transverse scanning. The measured thickness at the center of the sample was 24 μm and the average index was 1.4055 with the standard deviation of 0.0002.

Citation Download Citation

Jihoon Na, Woo June Choi, Hae Young Choi, Seon Young Ryu, Eun Seo Choi, and Byeong Ha Lee "Thickness and index measurements of a transparent specimen by full-field optical coherence microscopy", Proc. SPIE 7184, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVI, 71841B (3 March 2009); https://doi.org/10.1117/12.808971

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