Paper
23 February 2009 Quality evaluation of quasi-phase-matched devices by far-field diffraction pattern analysis
Krishnamoorthy Pandiyan, Yeon Sook Kang, Hwan Hong Lim, Byeong Joo Kim, Myoungsik Cha
Author Affiliations +
Abstract
Periodically poled ferroelectric crystals form highly efficient quasi-phase matched optical frequency conversion devices. For optimal performance of such devices, accurate period and duty-cycle are required throughout the poled region. For the quality evaluation we demonstrate a simple and a powerful technique using far-field diffraction measurement. Periodically poled lithium niobates were fabricated and etched out to reveal a surface-relief grating. The far-field diffraction pattern was analyzed to obtain statistical information for the duty-cycle. We explored the equivalence between the linear diffraction experiment and the conventional second-harmonic generation method for poling quality evaluation, through the Fourier-transform of the spatial modulation of domains.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Krishnamoorthy Pandiyan, Yeon Sook Kang, Hwan Hong Lim, Byeong Joo Kim, and Myoungsik Cha "Quality evaluation of quasi-phase-matched devices by far-field diffraction pattern analysis", Proc. SPIE 7197, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications VIII, 71970R (23 February 2009); https://doi.org/10.1117/12.808464
Lens.org Logo
CITATIONS
Cited by 7 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Diffraction

Far-field diffraction

Second-harmonic generation

Diffraction gratings

Fourier transforms

Crystals

Lithium niobate

Back to Top