RF device forensics using passband filter analysis

Deen King-Smith; Aravind K. Mikkilineni; Saul Gelfand; Edward J. Delp III

doi:10.1117/12.806056

4 February 2009 RF device forensics using passband filter analysis

Deen King-Smith, Aravind K. Mikkilineni, Saul Gelfand, Edward J. Delp III

Proceedings Volume 7254, Media Forensics and Security; 725419 (2009) https://doi.org/10.1117/12.806056
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States

Abstract

Given the wide use of Radio Frequency (RF) devices for applications ranging from data networks to wireless sensors, it is of interest to be able to characterize individual devices to verify compliance with FCC Part 15 rules. In an effort to characterize these types of devices we have developed a system that utilizes specially designed probe signals to elicit a response from the device from which unique characteristics can be extracted. The features that uniquely characterize a device are referred to as device signatures or device fingerprints. We apply this approach to RF devices which employ different bandpass filters, and construct training based classifiers which are highly accurate. We also introduce a model-based framework for optimal detection that can be employed to obtain performance limits, and to study model mismatch and probe optimization.

Citation Download Citation

Deen King-Smith, Aravind K. Mikkilineni, Saul Gelfand, and Edward J. Delp III "RF device forensics using passband filter analysis", Proc. SPIE 7254, Media Forensics and Security, 725419 (4 February 2009); https://doi.org/10.1117/12.806056

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