The application of PSD in the faultage x-ray photograph system

Shuyun Wang; Tianze Li

doi:10.1117/12.821180

6 March 2009 The application of PSD in the faultage x-ray photograph system

Shuyun Wang, Tianze Li

Proceedings Volume 7280, Seventh International Conference on Photonics and Imaging in Biology and Medicine; 72801W (2009) https://doi.org/10.1117/12.821180
Event: Photonics and Optoelectronics Meetings, 2008, Wuhan, China

Abstract

Expound the transverse photoelectrical effect, operating principle of the Position Sensitive Detector (PSD). Analyze the main aspects that cause the non-linearity: the heterogeneity of the materials used to make the PSD's N region, the electrodes' size and shape, the uneven resistance of the P region surface, the asymmetrical distribution of the junction capacitance, the temperature excursion and so on. When a beam irradiates the PSD, whose surface resistance is even, two photocurrents I₁ and I₂ will be obtained on both load resistors of the signal electrodes. Their magnitudes are determined by the incident beam position and the values of the equivalent resistances R₁ and R₂ between the two electrodes. The values of the load resistance can be ignored compared with the values of R₁ and R₂. After the processing of PSD's output signals, conclusion is drawn that the PSD's output signals only have relationship with the position, rather than the light intensity. The prominent merits of non-requirement of sample conversion and the ability to set up the position of ionization greatly shorten the period of image capture, which enables its utilization in Faultage X-ray photography. Expound the aspects which improve the filled air pressure as well as the detector's efficiency and resolution. At last, we analyze the PSD's dynamic response error, and draw some important conclusions. We also forecast the application of the combination of the PSD and the faultage X-ray photograph system in medical engineering.

Citation Download Citation

Shuyun Wang and Tianze Li "The application of PSD in the faultage x-ray photograph system", Proc. SPIE 7280, Seventh International Conference on Photonics and Imaging in Biology and Medicine, 72801W (6 March 2009); https://doi.org/10.1117/12.821180

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Electrodes

Resistance

X-rays

Signal processing

Photography

X-ray imaging

Error analysis

Show All Keywords

Keywords/Phrases

Search In:

Publication Years