Paper
20 May 2009 Measurement of phase noise through beat frequency
Yao He, Rongzhu Zhang
Author Affiliations +
Abstract
When testing the surface figure of large aperture optical components, phase noise of light source used in the phase shifting interferometer will influence the test precision. However, it is not easy to analyze the random phase noise directly. In order to have an understanding of phase noise, an experiment is designed to get beat frequency from two separate lasers. The possibility of obtaining phase noise from beat frequency is discussed. It is a good foundation for the improvement of the large aperture optical test system.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yao He and Rongzhu Zhang "Measurement of phase noise through beat frequency", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728309 (20 May 2009); https://doi.org/10.1117/12.828287
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KEYWORDS
Semiconductor lasers

Interferometers

Fiber lasers

Phase measurement

Phase shifting

Optical components

Optical testing

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