Study on interferometry with grating modulating optical fiber interference fringes phase

Qiang Dai; Yande Xu; Yijun Liang; Tao Geng; Ronggang Zhu; Wen Li

doi:10.1117/12.828784

20 May 2009 Study on interferometry with grating modulating optical fiber interference fringes phase

Qiang Dai, Yande Xu, Yijun Liang, Tao Geng, Ronggang Zhu, Wen Li

Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 72831C (2009) https://doi.org/10.1117/12.828784
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

A novel sinusoidal phase modulating optical fiber interferometers is described. The surface profile of an object can be measured by grating modulating optical fiber interference fringes. The ± first-order beams diffracted by the grating are coupled in two fibers and in optical fiber output two coherent point light source are generated. The two coherent point light sources have the same intensity so as to high contrast interference fringes are got. When piezoelectric ceramic vibrates with the grating, the position of ± first-order beams diffracted by the grating does not change but the phase of optical fiber output field interference fringes change periodic. By using sinusoidal phase modulating method can detect the phase variations of interference fringes and the surface profile of an object can be measured. Detail description about the optical principle, optical path design and phase modulating and demodulation are researched. The experiment shows that this measurement method can overcome fluctuate of light source intensity and wavelengths at the same time have the characteristic of high precision and large non-contact measurement range.

Citation Download Citation

Qiang Dai, Yande Xu, Yijun Liang, Tao Geng, Ronggang Zhu, and Wen Li "Study on interferometry with grating modulating optical fiber interference fringes phase", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 72831C (20 May 2009); https://doi.org/10.1117/12.828784

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KEYWORDS

Optical fibers

Modulation

Interferometers

Light sources

Phase interferometry

Projection systems

Diffraction

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