Method for recovering dynamic position of photoelectric encoder

Yong-zhi Wu; Qiu-hua Wan; Chang-hai Zhao; Ying Sun; Li-hui Liang; Yi-sheng Liu

doi:10.1117/12.828703

20 May 2009 Method for recovering dynamic position of photoelectric encoder

Yong-zhi Wu, Qiu-hua Wan, Chang-hai Zhao, Ying Sun, Li-hui Liang, Yi-sheng Liu

Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 728328 (2009) https://doi.org/10.1117/12.828703
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

This paper presents a method to recover dynamic position of photoelectric encoder. While working at dynamic state, original outputs of the photoelectric encoder are in theory two sine or triangular signals with a phase difference of π/2. However, there are still deviations of actual output signals. Interpolating on the basis of this deviation signal will result in interpolation errors. In dynamic state, true original signal data obtained by data acquisition system is a time equation. Through processing these data by data equiangular and harmonic analysis, the equation will be converted from time domain to position domain and an original position equation can be formed. Then the interpolation errors also can be obtained. By this method, the interpolation errors can be checked in dynamic state and it can also provide electric interpolation basis so that to improve dynamic interpolation precision of the encoder. Software simulation and experimental analysis all prove the method effective. This method is the basis in theory for precision checking and calibration in motion.

Citation Download Citation

Yong-zhi Wu, Qiu-hua Wan, Chang-hai Zhao, Ying Sun, Li-hui Liang, and Yi-sheng Liu "Method for recovering dynamic position of photoelectric encoder", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728328 (20 May 2009); https://doi.org/10.1117/12.828703

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