Application of CCD measurement technique for wear on pantograph sliding plates

Kai Yang; Li Wang; Xiaorong Gao; Quanke Zhao; Zeyong Wang; Chaoyong Peng

doi:10.1117/12.828760

20 May 2009 Application of CCD measurement technique for wear on pantograph sliding plates

Kai Yang, Li Wang, Xiaorong Gao, Quanke Zhao, Zeyong Wang, Chaoyong Peng

Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 728334 (2009) https://doi.org/10.1117/12.828760
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

Pantograph sliding plate is the most important electricity-collecting part in locomotive power supply system. Once the sliding plates are disabled, they will be severe dangerous for safety. The measurement for pantograph of 27.5KV is especially difficult. The article uses non-contact and online dynamic detection by utilizing CCD technique to solve the problem. The system will get all images of sliding plates after triggering by space arrangement of CCD cameras cooperated with flashlights. The precision of demarcate is guaranteed by special methods. It adopts directional edge search to get sliding plates, and connect the images of different CCDS. It also makes use of conditional Hough transformation to locate the wire. The wear on sliding plates will be given after complicated processing. The system is applicable to the detection for all kinds of pantographs by adding different arithmetic amends. At last the precision can achieve ±0.5mm . At the same time a database is setup which can give the trend curve of wear, it can predict the limit time of the sliding plates.

Citation Download Citation

Kai Yang, Li Wang, Xiaorong Gao, Quanke Zhao, Zeyong Wang, and Chaoyong Peng "Application of CCD measurement technique for wear on pantograph sliding plates", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728334 (20 May 2009); https://doi.org/10.1117/12.828760

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