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1 May 2009 Multispectral EO/IR sensor model for evaluating UV, visible, SWIR, MWIR and LWIR system performance
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Abstract
Next Generation EO/IR Sensors using Nanostructures are being developed for a variety of Defense Applications. In addition, large area IRFPA's are being developed on low cost substrates. In this paper, we will discuss the capabilities of a EO/IR Sensor Model to provide a robust means for comparing performance of infrared FPA's and Sensors that can operate in the visible and infrared spectral bands that coincide with the atmospheric windows - UV, Visible-NIR (0.4-1.8μ), SWIR (2.0-2.5μ), MWIR (3-5μ), and LWIR (8-14μ). The model will be able to predict sensor performance and also functions as an assessment tool for single-color and for multi-color imaging. The detector model can also characterize ZnO, Si, SiGe, InGaAs, InSb, HgCdTe and Nanostructure based Sensors. The model can predict performance by also placing the specific FPA into an optical system, evaluates system performance (NEI, NETD, MRTD, and SNR). This model has been used as a tool for predicting performance of state-of-the-art detector arrays and nanostructure arrays under development. Results of the analysis can be presented for various targets for each of the focal plane technologies for a variety of missions.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ashok K. Sood, Robert Richwine, Yash R. Puri, Nibir K. Dhar, Dennis L. Polla, and Priyalal S. Wijewarnasuriya "Multispectral EO/IR sensor model for evaluating UV, visible, SWIR, MWIR and LWIR system performance", Proc. SPIE 7300, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX, 73000H (1 May 2009); https://doi.org/10.1117/12.820899
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