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22 April 2009 MKV carrier vehicle sensor calibration
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The Multiple Kill Vehicle (MKV) system, which is being developed by the US Missile Defense Agency (MDA), is a midcourse payload that includes a carrier vehicle and a number of small kill vehicles. During the mission, the carrier vehicle dispenses the kill vehicles to address a complex threat environment and directs each kill vehicle toward the intercept point for its assigned threat object. As part of the long range carrier vehicle sensor development strategy, MDA and project leaders have developed a pathfinder sensor and are in the process of developing two subsequent demonstration sensors to provide proof of concept and to demonstrate technology. To increase the probability of successful development of the sensor system, detailed calibration measurements have been included as part of the sensor development. A detailed sensor calibration can provide a thorough understanding of sensor operation and performance, verifying that the sensor can meet the mission requirements. This approach to instrument knowledge will help ensure the program success and reduce cost and schedule risks. The Space Dynamics Laboratory at Utah State University (SDL) completed a calibration test campaign for the pathfinder sensor in April 2008. Similar calibration efforts are planned in 2009 for the two demonstration sensors. This paper provides an overview of calibration benefits, requirements, approach, facility, measurements, and preliminary results of the pathfinder calibration.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Joseph Tansock, Scott Hansen, Jason Williams, Bryan Sisko, Kajal Pancholi, Aaron Plotnik, Jon Albritton, Michael Margulis, Micah Kalscheur, Dan Welsh, Deon Dixon, Steven Brown, Katharine Ip, Karl Burk, Mark Greenman, James Peterson, Alan Bird, David Marchant, Dean Ferguson, Brent Haslem, and William Shaw "MKV carrier vehicle sensor calibration", Proc. SPIE 7300, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX, 73000X (22 April 2009);


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