Resistor array infrared projector nonuniformity correction: search for performance improvement IV

Leszek Swierkowski; Robert A. Joyce; Owen M. Williams

doi:10.1117/12.818433

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22 April 2009 Resistor array infrared projector nonuniformity correction: search for performance improvement IV

Leszek Swierkowski, Robert A. Joyce, Owen M. Williams

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Proceedings Volume 7301, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV; 73010M (2009) https://doi.org/10.1117/12.818433
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

We assess the issues that need to be addressed to ensure that a resistor array infrared projector is capable of validly simulating the real world. These include control of the additional sources of blurring and aliasing arising from the presence of the projector and its associated scene generation system, nonuniformity correction, busbar robbing, spurious back reflections and narcissus. In particular, we reconfirm that a 2 × 2 projector/unit-under-test pixel mapping ratio offers a good compromise for controlling the additional blurring and aliasing, and furthermore, we demonstrate achievement of projector nonuniformity noise equivalent temperature differences (NETDs) in the 20 mK range.

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Leszek Swierkowski, Robert A. Joyce, and Owen M. Williams "Resistor array infrared projector nonuniformity correction: search for performance improvement IV", Proc. SPIE 7301, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV, 73010M (22 April 2009); https://doi.org/10.1117/12.818433

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