Terahertz backscattering behavior of various absorbing materials

C. Wu; A. J. Gatesman; L. DeRoeck; T. Horgan; R. H. Giles; W. E. Nixon

doi:10.1117/12.822189

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30 April 2009 Terahertz backscattering behavior of various absorbing materials

C. Wu, A. J. Gatesman, L. DeRoeck, T. Horgan, R. H. Giles, W. E. Nixon

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Proceedings Volume 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense; 73110M (2009) https://doi.org/10.1117/12.822189
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

The Submillimeter-Wave Technology Laboratory (STL) at the University of Massachusetts Lowell has investigated the electromagnetic scattering behavior of various broadband absorbers. Several absorbing materials were tested in a compact radar range operating at a center frequency of 160 GHz. The polarimetric radar cross section was measured at elevation angles from 15° to 75°. In addition to the backscattering behavior, the normal incidence transmittance of the materials was evaluated.

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C. Wu, A. J. Gatesman, L. DeRoeck, T. Horgan, R. H. Giles, and W. E. Nixon "Terahertz backscattering behavior of various absorbing materials", Proc. SPIE 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense, 73110M (30 April 2009); https://doi.org/10.1117/12.822189

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