Longwave multispectral diffractive optic imaging spectrometer

David Kryskowski; Justin Renken

doi:10.1117/12.819070

27 April 2009 Longwave multispectral diffractive optic imaging spectrometer

David Kryskowski, Justin Renken

Proceedings Volume 7334, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV; 73340G (2009) https://doi.org/10.1117/12.819070
Event: SPIE Defense, Security, and Sensing, 2009, Orlando, Florida, United States

Abstract

Ann Arbor Sensor Systems is developing and experimenting with a Long Wave Multispectral Diffractive Optic Imaging Spectrometer that operates in the 7 to 14 micron band. The instrument currently under development is for fixed mount applications. The focal plane is an uncooled 320 x 240 30 micron pitch amorphous silicon microbolometer array. With a spectral bandwidth of 220nm the unit is capable of resolving moderate to broad spectral features. This paper will describe the physical characteristics and characterization of the experimental device. Design trades and test data will be presented.

Citation Download Citation

David Kryskowski and Justin Renken "Longwave multispectral diffractive optic imaging spectrometer", Proc. SPIE 7334, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV, 73340G (27 April 2009); https://doi.org/10.1117/12.819070

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available