Crystal characterization for a gamma-ray Laue concentrator

M. Skulinova; C. Pelliciari; L. Hanlon; B. McBreen; F. O'Reilly

doi:10.1117/12.829138

30 April 2009 Crystal characterization for a gamma-ray Laue concentrator

M. Skulinova, C. Pelliciari, L. Hanlon, B. McBreen, F. O'Reilly

Proceedings Volume 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space; 736019 (2009) https://doi.org/10.1117/12.829138
Event: SPIE Optics + Optoelectronics, 2009, Prague, Czech Republic

Abstract

A laboratory system with a crystal concentrator for focusing γ-rays has been developed. The facility has been designed in particular for tests of diffraction systems based on small crystals in the Bragg and Laue configurations. Two radioactive sources (Co-57 and Ba-133) are being used to cover the energy range from 30 to 400 keV. The diffracted beam is detected using Germanium (HPGe) and CdZnTe detectors. We report on the preliminary characterization of crystal mosaicities for different crystals.

Citation Download Citation

M. Skulinova, C. Pelliciari, L. Hanlon, B. McBreen, and F. O'Reilly "Crystal characterization for a gamma-ray Laue concentrator", Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 736019 (30 April 2009); https://doi.org/10.1117/12.829138

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