Scanning probe measurements of CuI doped single-walled carbon nanotubes

Alexey A. Zhukov; Valentina K. Gartman; Andrey A. Eliseev

doi:10.1117/12.821746

28 May 2009 Scanning probe measurements of CuI doped single-walled carbon nanotubes

Alexey A. Zhukov, Valentina K. Gartman, Andrey A. Eliseev

Proceedings Volume 7364, Nanotechnology IV; 73640O (2009) https://doi.org/10.1117/12.821746
Event: SPIE Europe Microtechnologies for the New Millennium, 2009, Dresden, Germany

Abstract

We performed a set of non-contact measurements using scanning probe microscope at room temperature such as Kelvin probe measurements and measurements of local differential capacitance of single-walled carbon nanotubes (SWCNT) doped with CuI. SWCNT with essential deviated values of work function were observed with Kelvin probe measurements. Deviations of work function we attribute to the presence and of CuI impurities and their peculiarities of structure. Differential capacitance measurements demonstrated absence of the essential decrease of the conductivity because if of CuI dopant.

Citation Download Citation

Alexey A. Zhukov, Valentina K. Gartman, and Andrey A. Eliseev "Scanning probe measurements of CuI doped single-walled carbon nanotubes", Proc. SPIE 7364, Nanotechnology IV, 73640O (28 May 2009); https://doi.org/10.1117/12.821746

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