Paper
24 November 2010 Surface plasmon dispersive spectroscopy of thin films at terahertz frequencies
A. K. Nikitin, O. V. Khitrov, A. P. Kyrianov, B. A. Knyazev, G. N. Zhizhin
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Proceedings Volume 7376, Laser Applications in Life Sciences; 73760U (2010) https://doi.org/10.1117/12.882403
Event: Laser Applications in Life Sciences 2010, 2010, Oulu, Finland
Abstract
A number of surface plasmon (SP) techniques and devices for terahertz (THz) dispersive spectroscopy of thin films have been developed and reviewed. The techniques are based on the strong dependence of SP complex refractive index κ on the transition layer optical constants. Three of the mentioned techniques employ interference in parallel or quasi parallel beams of bulk and (or) surface waves. These three are remarkable for their accuracy and enable investigators to determine both (real and imaginary) parts of κ in one measuring procedure. Some devices implementing the techniques are static and can have measuring time equal to one pulse duration. Besides, two noninterferometric techniques intended for determining only the real part of κ and assuming tunable monochromatic THz sources are described.
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A. K. Nikitin, O. V. Khitrov, A. P. Kyrianov, B. A. Knyazev, and G. N. Zhizhin "Surface plasmon dispersive spectroscopy of thin films at terahertz frequencies", Proc. SPIE 7376, Laser Applications in Life Sciences, 73760U (24 November 2010); https://doi.org/10.1117/12.882403
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Cited by 4 scholarly publications.
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KEYWORDS
Surface plasmons

Terahertz radiation

Spectroscopy

Beam splitters

Mirrors

Refractive index

Sensors

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