Paper
11 May 2009 Reduction of MRC error review time through the simplified and classified MRC result
Casper W. Lee, Jason C. Lin, Frank F. Chen
Author Affiliations +
Abstract
As the Manufacturing Rule Check (MRC) error counts are very huge, it has been getting difficult to review by each point and maybe some of the design errors will be ignored. It's necessary to reduce the review error counts and improve the checking methods. The paper presents an error classification function and auto-waived mechanism for decreasing the repeated MRC errors in MRC report. In auto-waived mechanism, the report will omit the error point if it is same as previous report and the defect location output will keep all of the error points for Do Not Inspection Area (DNIR) reference. (DNIR needs customer's approval). Furthermore, it is possible to develop an auto-waived function to skip the confirmed errors which is provided by customer with a marking information table or GDS/OASIS database. Besides, this paper also presents how these errors can be grouping and reducing checking time.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Casper W. Lee, Jason C. Lin, and Frank F. Chen "Reduction of MRC error review time through the simplified and classified MRC result", Proc. SPIE 7379, Photomask and Next-Generation Lithography Mask Technology XVI, 73790X (11 May 2009); https://doi.org/10.1117/12.824274
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KEYWORDS
Error analysis

Databases

Photomasks

Inspection

Cesium

Current controlled current source

Lithium

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