Double crystal probe with one transmitter and multiple receivers for automatic inspection

Qingkai Liu; Jiarui Liu

doi:10.1117/12.835518

24 August 2009 Double crystal probe with one transmitter and multiple receivers for automatic inspection

Qingkai Liu, Jiarui Liu

Proceedings Volume 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors; 73812D (2009) https://doi.org/10.1117/12.835518
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

A novel type of double-crystal probe with one transmitter and multiple receivers is developed. Based on the probe with one transmitter and one receiver, this designed probe includes one longer transmitting crystal plate and multiple receiving crystal plates with the same length each other. These receiving crystal plates can receive respectively ultrasound echo at the same time. We have manufactured the probe with one transmitter and three or four receivers. Finally we carry out the integrated experiment to test the performance of probe. The testing result shows that three receiving crystal plates have the equal effective sound beam width and uniform sound field distribution. Contrasted to the conventional probe, the novel probe not only overcomes the disadvantage that flaw quantitative error enlarges with the increment of transmitting crystal plate length, but also improves the dynamic coupling stability of probe at the mean time of increasing effective sound beam width. Moreover, resolution to detect flaw near the surface is also advanced. This type of probe can improve effectively the testing speed and flaw detection sensitivity. So the qualification of thick steel plates' automatic inspection is also improved greatly.

Citation Download Citation

Qingkai Liu and Jiarui Liu "Double crystal probe with one transmitter and multiple receivers for automatic inspection", Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 73812D (24 August 2009); https://doi.org/10.1117/12.835518

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