Translator Disclaimer
Paper
4 August 2009 Infrared imaging characterization of ground scene
Author Affiliations +
Abstract
As prerequisite and foundation, the study of infrared imaging characterization for different ground scene in different time under different meteorological condition is the key of infrared image registration and ATR. In order to find out the proper time and optimum scene which is suitable for image registration, a great deal of aerial image sequences is analyzed in different season and different time at same region. Furthermore, a new metrics is put forward to measure the variation of IR scene with some statistical parameters, such as mean, standard deviation, POE. The metrics is designed to describe different scene properties quantitatively so as to evaluate the stability of scene MWIR imaging .According to the result of MWIR and visible image registration with NPROD, the proposed method can be used to correctly select reference area and increase the probability of map matching.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zheng-hui Zhang and Shi-wen Xu "Infrared imaging characterization of ground scene", Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73830K (4 August 2009); https://doi.org/10.1117/12.836185
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Characterization of infrared cloud background clutter
Proceedings of SPIE (September 21 1992)
IR-visible image sensor for diagnosis of ground object
Proceedings of SPIE (December 12 2001)
New infrared blur estimation and restoration algorithm
Proceedings of SPIE (December 06 1999)
An efficient method for infrared small target detection
Proceedings of SPIE (September 08 2011)
Unique scene description from radar and infrared images
Proceedings of SPIE (October 01 1990)
Measuring important parameters for air-sea heat exchange
Proceedings of SPIE (March 15 2002)

Back to Top