System identification of tracking error and evaluation of tracking performance using BP neural network

Ning Zhang; Xiang-heng Shen

doi:10.1117/12.834237

5 August 2009 System identification of tracking error and evaluation of tracking performance using BP neural network

Ning Zhang, Xiang-heng Shen

Proceedings Volume 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications; 73832F (2009) https://doi.org/10.1117/12.834237
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

A novel approach for evaluating the tracking performance of optoelectronic theodolite is proposed. First, an equivalent mathematic model of tracking error is established. Then, the equivalent sine signal is inputted to the equivalent model, and the outputs are sampled. The results of evaluating the tracking performance are obtained based on the statistical calculation of output produced by equivalent model. Equivalent model using the BP (Backprogration) neural network structure is identified. The training method of BP neural network adopts the LM (Levenberg-Marquardt) algorithm for the sake of speeding up training process. The BP neural network is trained and tested by using the training and testing samples gotten from the simulation model of optoelectronic theodolite tracking system under MATLAB/SIMULINK. The estimate errors of equivalent model including average error, maximum error and standard error are 2.5872e-006°≈0°, 2.8" and 1.9". The results show that the equivalent model identified based on BP neural network meets the needs of evaluating the tracking performance of optoelectronic theodolite. The accurate evaluation of tracking performance is achieved.

Citation Download Citation

Ning Zhang and Xiang-heng Shen "System identification of tracking error and evaluation of tracking performance using BP neural network", Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73832F (5 August 2009); https://doi.org/10.1117/12.834237

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available