On the characterization of a random monolayer of particles from coherent optical reflectance

F. Alarcón-Oseguera; M. Peña-Gomar; A. García-Valenzuela; F. Castillo; E. Pérez

doi:10.1117/12.839606

4 August 2009 On the characterization of a random monolayer of particles from coherent optical reflectance

F. Alarcón-Oseguera, M. Peña-Gomar, A. García-Valenzuela, F. Castillo, E. Pérez

Proceedings Volume 7386, Photonics North 2009; 738612 (2009) https://doi.org/10.1117/12.839606
Event: Photonics North 2009, 2009, Quebec, Canada

Abstract

We present the viability of obtaining the particle size and surface coverage in a monolayer of polystyrene particles adsorbed on a glass surface from optical coherent reflectance data around the critical angle in an internal reflection configuration. We have found that fitting a CSM to optical reflectivity curves in an internal reflection configuration around the critical angle with a dilute random monolayer of particles adsorbed on the surface can in fact provide the particle's radius and surface coverage once the particles are sufficiently large.

Citation Download Citation

F. Alarcón-Oseguera, M. Peña-Gomar, A. García-Valenzuela, F. Castillo, and E. Pérez "On the characterization of a random monolayer of particles from coherent optical reflectance", Proc. SPIE 7386, Photonics North 2009, 738612 (4 August 2009); https://doi.org/10.1117/12.839606

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