Characterization of the time-frequency parameters inherent in the radiation of semiconductor heterolasers using interferometric technique

Alexandre S. Shcherbakov; Pedro Moreno Zarate; Joaquin Campos Acosta; Yurij V. Il'n; Il'ya S. Tarasov

doi:10.1117/12.838469

4 August 2009 Characterization of the time-frequency parameters inherent in the radiation of semiconductor heterolasers using interferometric technique

Alexandre S. Shcherbakov, Pedro Moreno Zarate, Joaquin Campos Acosta, Yurij V. Il'n, Il'ya S. Tarasov

Author Affiliations +

Proceedings Volume 7386, Photonics North 2009; 73862H (2009) https://doi.org/10.1117/12.838469
Event: Photonics North 2009, 2009, Quebec, Canada

Abstract

The specific approach to characterizing the train-average parameters of low-power picosecond optical pulses with the frequency chirp, arranged in high-repetition-frequency trains, in both time and frequency domains is elaborated for the important case when semiconductor heterolasers operate in the active mode-locking regime. This approach involves the joint Wigner time-frequency distributions, which can be created for those pulses due to exploitation of a novel interferometric technique under discussion. Practically, the InGaAsP/InP-heterolasers generating at the wavelength 1320 nm were used during the experiments carried out and an opportunity of reconstructing the corresponding joint Wigner time-frequency distributions was successfully demonstrated.

Citation Download Citation

Alexandre S. Shcherbakov, Pedro Moreno Zarate, Joaquin Campos Acosta, Yurij V. Il'n, and Il'ya S. Tarasov "Characterization of the time-frequency parameters inherent in the radiation of semiconductor heterolasers using interferometric technique", Proc. SPIE 7386, Photonics North 2009, 73862H (4 August 2009); https://doi.org/10.1117/12.838469

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