Paper
13 September 2010 Measurement of elasto-plastic deformations by speckle interferometry
Marco Bova, Luigi Bruno, Andrea Poggialini
Author Affiliations +
Proceedings Volume 7387, Speckle 2010: Optical Metrology; 73870F (2010) https://doi.org/10.1117/12.871142
Event: Speckle 2010, 2010, Florianapolis, Brazil
Abstract
In the paper the authors present an experimental equipment for elasto-plastic characterization of engineering materials by tensile tests. The stress state is imposed to a dog bone shaped specimen by a testing machine fixed on the optical table and designed for optimizing the performance of a speckle interferometer. All three displacement components are measured by a portable speckle interferometer fed by three laser diodes of 50 mW, by which the deformations of a surface of about 6×8 mm2 can be fully analyzed in details. All the equipment is driven by control electronics designed and realized on purpose, by which it is possible to accurately modify the intensity of the illumination sources, the position of a PZT actuator necessary for applying phase-shifting procedure, and the overall displacement applied to the specimen. The experiments were carried out in National Instrument LabVIEW environment, while the processing of the experimental data in Wolfram Mathematica environment. The paper reports the results of the elasto-plastic characterization of a high strength steel specimen.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marco Bova, Luigi Bruno, and Andrea Poggialini "Measurement of elasto-plastic deformations by speckle interferometry", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73870F (13 September 2010); https://doi.org/10.1117/12.871142
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometers

Speckle

Actuators

Control systems

Electronics

Semiconductor lasers

Speckle interferometry

Back to Top