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13 September 2010 Portable profilometer based on low-coherence interferometry and smart pixel camera
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Proceedings Volume 7387, Speckle 2010: Optical Metrology; 738714 (2010)
Event: Speckle 2010, 2010, Florianapolis, Brazil
Although low coherence interferometers are commercially available (e.g., white light interferometers), they are generally quite bulky, expensive, and offer limited flexibility. In the paper the new portable profilometer based on low coherence interferometry is presented. In the device the white light diode with controlled spectrum shape is used in order to increase the zero order fringe contrast, what allows for its better and quicker localization. For image analysis the special type of CMOS matrix (called smart pixel camera), synchronized with reference mirror transducer, is applied. Due to hardware realization of the fringe contrast analysis, independently in each pixel, the time of measurement decreases significantly. High speed processing together with compact design allows that profilometer to be used as the portable device for both in and out door measurements. The capabilities of the designed profilometer are well illustrated by a few application examples.
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Leszek Salbut, Anna Pakuła, Sławomir Tomczewski, and Adam Styk "Portable profilometer based on low-coherence interferometry and smart pixel camera", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 738714 (13 September 2010);

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