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13 September 2010 Speckle reduction in line-scan laser projectors using binary phase codes: theory and experiments
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Proceedings Volume 7387, Speckle 2010: Optical Metrology; 73871P (2010) https://doi.org/10.1117/12.869420
Event: Speckle 2010, 2010, Florianapolis, Brazil
Abstract
Barker binary phase code of maximum length 13 has previously been used for speckle reduction in line-scan laser projectors, and a speckle contrast factor decreased down to 13% has been achieved. In this article, Barker-like binary phase codes of length longer than 13 are used at an intermediate image plane. It is shown by theoretical calculation that much better speckle reduction with speckle contrast factor up to 6% can be achieved by using longer binary phase codes other than the Barker code. Preliminary experimental results are also presented indictaing good speckle reduction.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Nadeem Akram, Guangmin Ouyang, Wenhong Gao, Zhaomin Tong, and Xuyuan Y. Chen "Speckle reduction in line-scan laser projectors using binary phase codes: theory and experiments", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73871P (13 September 2010); https://doi.org/10.1117/12.869420
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