Translator Disclaimer
Paper
17 June 2009 Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm
Author Affiliations +
Abstract
Temporal carrier has been introduced to electronic speckle interferometry (ESPI) in order to produce virtual speckle patterns. Dynamic deformation measurement with a large deformation is performed by using virtual speckle patterns. However, it takes a long calculating time to produce virtual speckle patterns, because the method requires Fourier transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by algorithm without Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved remarkably, and that the new method also is equal to the ordinary methods in measurement accuracy.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Arai, Y. Tsutsumi, and S. Yokozeki "Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890I (17 June 2009); https://doi.org/10.1117/12.824186
PROCEEDINGS
9 PAGES


SHARE
Advertisement
Advertisement
Back to Top