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24 November 2009 3D shape measurement using curvature data - Erratum
ByoungChang Kim, MinChel Kwon, ByoungUck Choo, InJeong Yoon
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Proceedings Volume 7389, Optical Measurement Systems for Industrial Inspection VI; 73893M (2009) https://doi.org/10.1117/12.853927
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany
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© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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ByoungChang Kim, MinChel Kwon, ByoungUck Choo, and InJeong Yoon "3D shape measurement using curvature data - Erratum", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73893M (24 November 2009); https://doi.org/10.1117/12.853927
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KEYWORDS
3D metrology
Interferometers
Aspheric lenses
Mirrors
Photovoltaics
Sensors
Profilometers
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