Relationship between the contact angle and the tilt angle on the vertical polymer layer of NLC using various ion beam exposure energy

Ji-Hun Lim; Young-Hwan Kim; Byeong-Yun Oh; Byoung-Yong Kim; Jeong-Min Han; Jeong-Yeon Hwang; Dae-Shik Seo

doi:10.1117/12.830959

20 August 2009 Relationship between the contact angle and the tilt angle on the vertical polymer layer of NLC using various ion beam exposure energy

Ji-Hun Lim, Young-Hwan Kim, Byeong-Yun Oh, Byoung-Yong Kim, Jeong-Min Han, Jeong-Yeon Hwang, Dae-Shik Seo

Author Affiliations +

Proceedings Volume 7404, Nanostructured Thin Films II; 74040X (2009) https://doi.org/10.1117/12.830959
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States

Abstract

Recently, the relationship between surface energy and tilt angle on vertical polyimide (PI) was studied. The study showed that ion beam (IB) exposure using argon gas changes the surface energy of vertical PI as a function of exposure time. This characteristic induces the transition of vertical liquid crystal (LC) orientation from vertical to homogeneous. In this study, we applied the property to fabricate liquid crystal displays (LCD) with both vertical alignment (VA) and twisted nematic (TN) LCDs on vertical PI. The study revealed correlations between various IB exposure energies and surface energies with the same exposure time on vertical PI. X-ray photoelectron spectroscopic spectra were analyzed to prove the correlations and transmittance curves via applied voltage to VA, and TN LCDs were evaluated to observe the LC driving performance on IB-irradiated vertical PI.

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Ji-Hun Lim, Young-Hwan Kim, Byeong-Yun Oh, Byoung-Yong Kim, Jeong-Min Han, Jeong-Yeon Hwang, and Dae-Shik Seo "Relationship between the contact angle and the tilt angle on the vertical polymer layer of NLC using various ion beam exposure energy", Proc. SPIE 7404, Nanostructured Thin Films II, 74040X (20 August 2009); https://doi.org/10.1117/12.830959

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