Orthonormal vector polynomials in a unit circle, application: fitting mapping distortions in a null test

Chunyu Zhao; James H. Burge

doi:10.1117/12.828288

21 August 2009 Orthonormal vector polynomials in a unit circle, application: fitting mapping distortions in a null test

Chunyu Zhao, James H. Burge

Proceedings Volume 7426, Optical Manufacturing and Testing VIII; 74260V (2009) https://doi.org/10.1117/12.828288
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

We developed a complete and orthonormal set of vector polynomials defined over a unit circle. One application of these vector polynomials is for fitting the mapping distortions in an interferometric null test. This paper discusses the source of the mapping distortions and the approach of fitting the mapping relations, and justifies why the set of vector polynomials is the appropriate choice for this purpose. Examples are given to show the excellent fitting results with the polynomials.

Citation Download Citation

Chunyu Zhao and James H. Burge "Orthonormal vector polynomials in a unit circle, application: fitting mapping distortions in a null test", Proc. SPIE 7426, Optical Manufacturing and Testing VIII, 74260V (21 August 2009); https://doi.org/10.1117/12.828288

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available