Paper
10 September 2009 Microscopic TV sherography for microsystems characterization
Author Affiliations +
Abstract
Microscopic TV holography (MTVH) is widely used for out-of-plane deformation and 3-D surface profile characterization of microsystems. However, the problem of overcrowding of fringes shows up when deformations are large, making quantitative fringe analysis difficult. In this paper, we introduce the use of microscopic TV sherography (MTVS) for microsystems characterization so that under relatively large out-of-plane deformation the slope of deformation is measured, rather than the deformation itself. The optical arrangement consists of a zoom imaging system with a conventional Michelson shear interferometer. We use the digital speckle photography (DSP) technique for precise measurement of magnitude of the lateral shear introduced between the two sheared images.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
U. Paul Kumar, N. Krishna Mohan, and M. P. Kothiyal "Microscopic TV sherography for microsystems characterization", Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320T (10 September 2009); https://doi.org/10.1117/12.825766
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Digital signal processing

Speckle

Digital photography

Microsystems

Interferometers

Mirrors

Digital filtering

RELATED CONTENT

Whole-field speckle strain sensor
Proceedings of SPIE (May 07 1999)
Fringe analysis today and tomorrow
Proceedings of SPIE (May 27 2003)

Back to Top