Translator Disclaimer
Paper
31 August 2009 Surface smoothness requirements for the mirrors of the IXO x-ray telescope
Author Affiliations +
Abstract
The International X-ray Observatory (IXO) is a very ambitious mission, aimed at the X-ray observation of the early Universe. This makes IXO extremely demanding in terms of effective area and angular resolution. In particular, the HEW requirement below 10 keV is 5 arcsec Half-Energy Width (HEW). At higher photon energies, the HEW is expected to increase, and the angular resolution to be correspondingly degraded, due to the increasing relevance of the X-ray scattering off the reflecting surfaces. Therefore, the HEW up to 40 keV is required to be better than 30 arcsec, even though the IXO goal is to achieve an angular resolution as close as possible to 5 arcsec also at this energy. To this end, the roughness of the reflecting surfaces has to not exceed a tolerance, expressed in terms of a surface roughness PSD (Power-Spectral-Density). In this work we provide such tolerances by simulating the HEW scattering term for IXO, assuming a specific configuration for the optical module and different hypotheses on the PSD of mirrors.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Spiga and G. Pareschi "Surface smoothness requirements for the mirrors of the IXO x-ray telescope", Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74371M (31 August 2009); https://doi.org/10.1117/12.827258
PROCEEDINGS
10 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Aberration-free silicon pore x-ray optics
Proceedings of SPIE (September 26 2013)
Silicon pore optics for the international x-ray observatory
Proceedings of SPIE (November 20 2017)
Novel design of a large x ray optical system for...
Proceedings of SPIE (October 15 2012)
Novel x-ray optics with Si wafers and formed glass
Proceedings of SPIE (June 13 2006)
Optical design of the x-ray telescope for XEUS
Proceedings of SPIE (September 08 2005)

Back to Top