You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
21 August 2009The extension of the NIST BRDF scale from 1100 nm to 2500 nm
Measurements of bi-directional reflectance factor for diffuse reflectance from 1100 nm to 2500 nm using extended-range
indium gallium arsenide (exInGaAs) detectors in the NIST Spectral Tri-function Automated Reference
Reflectometer (STARR) facility are described. The determination of bi-directional reflectance factor with low
uncertainties requires the exInGaAs radiometer to be characterized for low-noise performance, linearity and spatial
uniformity. The instrument characterizations will be used to establish a total uncertainty budget for the reflectance
factor. To independently check the bi-directional reflectance factors, measurements also were made in a separate facility
in which the reflectance factor is determined using calibrated spectral irradiance and radiance standards. The total
combined uncertainties for the diffuse reflectances range from < 1 % at 1100 nm to 2.5 % at 2500 nm. At NIST, these
measurement capabilities will evolve into a calibration service for diffuse spectral reflectance in this wavelength region.
The alert did not successfully save. Please try again later.
Howard W. Yoon, David W. Allen, George P. Eppeldauer, Benjamin K. Tsai, "The extension of the NIST BRDF scale from 1100 nm to 2500 nm," Proc. SPIE 7452, Earth Observing Systems XIV, 745204 (21 August 2009); https://doi.org/10.1117/12.827293