Paper
10 September 1987 Multiple-Exposure Laser Speckle Velocimetry for Fluid Flow Measurement
T. D. Dudderar, R. Meynart
Author Affiliations +
Proceedings Volume 0746, Industrial Laser Interferometry; (1987) https://doi.org/10.1117/12.939777
Event: OE LASE'87 and EO Imaging Symposium, 1987, Los Angeles, CA, United States
Abstract
In laser speckle velocimetry or LSV a sheet of laser light is used to illuminate a plane of interest within a volume of moving fluid which has been properly seeded to assure efficient scattering. An accurately focussed photograph of the resulting side scattered intensity field provides a pattern of (depending on the effective seeding concentration) either particle images or coherent speckle which is directly related to the existing two-dimensional flow field in the plane of interest. If the illumination is appropriately interrupted while recording particle images, the resulting photograph or LSV specklegram will include many discrete recordings of each particle image. A positive transparency print of this multiple exposure LSV particle image specklegram may readily by analyzed optically by either a point-by-point "Young's fringe" technique or a full-field "Fourier filtering" technique to produce quantitative velocity field informa-tion with superior signal-to-noise characteristics. Computer aided image processing and data interpretation techniques are also used to provide further enhancement and conve-nience. In this paper the sources and consequences of signal decorrelation and noise are discussed in detail, and compared with those obtained using double exposure LSV (either coherent speckle or particle image).
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. D. Dudderar and R. Meynart "Multiple-Exposure Laser Speckle Velocimetry for Fluid Flow Measurement", Proc. SPIE 0746, Industrial Laser Interferometry, (10 September 1987); https://doi.org/10.1117/12.939777
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KEYWORDS
Particles

Speckle

Fringe analysis

Diffraction

Laser scattering

Photography

Visibility

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