Analysis of errors in an optical controlled-NOT gate

Tomohisa Nagata; Ryo Okamoto; Keiji Sasaki; Shigeki Takeuchi

doi:10.1117/12.829607

26 August 2009 Analysis of errors in an optical controlled-NOT gate

Tomohisa Nagata, Ryo Okamoto, Keiji Sasaki, Shigeki Takeuchi

Proceedings Volume 7465, Quantum Communications and Quantum Imaging VII; 746513 (2009) https://doi.org/10.1117/12.829607
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

The errors in linear optics controlled not (C-NOT) gates are analyzed considering the polarization-dependent phase sifts, in addition to the incorrectness of the beam splitting ratios. It is shown that the phase sifts at the optical components is as crucial as other error sources discussed in the previous studies. Such a phase shift unintentionally changes the linearly-polarized photons into a elliptically polarized ones. The operators for a beam splitting device and the process matrix of the C-NOT operation including such errors are also given.

Citation Download Citation

Tomohisa Nagata, Ryo Okamoto, Keiji Sasaki, and Shigeki Takeuchi "Analysis of errors in an optical controlled-NOT gate", Proc. SPIE 7465, Quantum Communications and Quantum Imaging VII, 746513 (26 August 2009); https://doi.org/10.1117/12.829607

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