Effective nonlinear refractive index of nano-porous silicon and its dependence on porosity and light wavelength

Tatiana Bazaru; Valentin I. Vlad; Adrian Petris; Mihaela Miu

doi:10.1117/12.866770

17 May 2010 Effective nonlinear refractive index of nano-porous silicon and its dependence on porosity and light wavelength

Tatiana Bazaru, Valentin I. Vlad, Adrian Petris, Mihaela Miu

Author Affiliations +

Proceedings Volume 7469, ROMOPTO 2009: Ninth Conference on Optics: Micro- to Nanophotonics II; 74690D (2010) https://doi.org/10.1117/12.866770
Event: ROMOPTO 2009, 2009, Sibiu, Romania

Abstract

In this paper, we study the dependence of effective optical linear and nonlinear refractive indices of nano-porous silicon layers on crystalline silicon substrates on fill fraction, at different light wavelengths in visible and near-infrared. Simple approximative formulae, in the frame of Bruggeman's formalism, that describe the dependences of effective optical linear and nonlinear refractive indices of nano-porous silicon on fill fractions and on wavelength, in the range of 620 - 1000 nm, are derived. Experimental results with reflection intensity scan show a good agreement with the data provided by our formulae and the exact results of Boyd-Bruggeman's formalism for the third order nonlinearity, in the case nanoporous silicon with different porosity and at light wavelengths in the mentioned spectral range.

Citation Download Citation

Tatiana Bazaru, Valentin I. Vlad, Adrian Petris, and Mihaela Miu "Effective nonlinear refractive index of nano-porous silicon and its dependence on porosity and light wavelength", Proc. SPIE 7469, ROMOPTO 2009: Ninth Conference on Optics: Micro- to Nanophotonics II, 74690D (17 May 2010); https://doi.org/10.1117/12.866770

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