Paper
23 September 2009 pRSM: models for model-based litho-hotspot repairs
Marko Chew, Toshikazu Endo, Yue Yang
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Abstract
Computing repair hints for litho hotspots is made more effective with a model of how Process Window contour bands changes as a function of design layout changes. We have developed a modeling methodology called pRSM (Partition Response Surface Model). In our approach, we create a family of models along with error bound estimate models. We first classify design layout configurations into a small number of partition categories and then build a RSM model and error bound model for each partition category. In this paper we describe our pRSM methodology and present results illustrating the advantages of our methodology over that of traditional RSM approaches.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marko Chew, Toshikazu Endo, and Yue Yang "pRSM: models for model-based litho-hotspot repairs", Proc. SPIE 7488, Photomask Technology 2009, 74883L (23 September 2009); https://doi.org/10.1117/12.829723
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Cited by 1 scholarly publication.
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KEYWORDS
Data modeling

Error analysis

Calibration

Model-based design

Resolution enhancement technologies

Statistical modeling

Raster graphics

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