GIS-based quality analysis on the cultivated land resources in poor areas of China

Ying Jie Wang

doi:10.1117/12.836411

10 July 2009 GIS-based quality analysis on the cultivated land resources in poor areas of China

Ying Jie Wang

Proceedings Volume 7491, PIAGENG 2009: Remote Sensing and Geoscience for Agricultural Engineering; 74910G (2009) https://doi.org/10.1117/12.836411
Event: International Conference on Photonics and Image in Agriculture Engineering (PIAGENG 2009), 2009, Zhangjiajie, China

Abstract

Cultivated land resource is a key factor that affects the development standard of a region. By analysis of land use and land cover data in 2000, together with national geographical data, soil fertility comprehensive quality assessment data (1980), a GIS-based research is carried out on the quality analysis of cultivated land resources in poor areas. Firstly, data mining methods are used to gather the inter-relationships between the poor areas' cultivated land resources and its geographical background factors. Secondly, comparative analysis between the poor areas and non-poor areas is conducted to reveal the difference. Results show that the big difference exists in the basic natural features of the cultivated land resources between poor and non-poor areas. Although the quantity of cultivated land resource in those poor areas is not less than that of non-poor areas, the quality is lowly evaluated because of its high elevation, steep slope and earth surface roughness. Finally, after overlay analysis, the natural quality of cultivated land resources in poor areas is assessed according to their topographical and soil fertility features.

Citation Download Citation

Ying Jie Wang "GIS-based quality analysis on the cultivated land resources in poor areas of China", Proc. SPIE 7491, PIAGENG 2009: Remote Sensing and Geoscience for Agricultural Engineering, 74910G (10 July 2009); https://doi.org/10.1117/12.836411

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available