Paper
30 October 2009 Utilizing semi-parametric model to compensate systematic errors in photogrammetry
Huiping Zhu, Li Yan, Fei Deng
Author Affiliations +
Proceedings Volume 7498, MIPPR 2009: Remote Sensing and GIS Data Processing and Other Applications; 74982L (2009) https://doi.org/10.1117/12.833177
Event: Sixth International Symposium on Multispectral Image Processing and Pattern Recognition, 2009, Yichang, China
Abstract
In photogrammetry data processing, the uncertainties in the observations will lead to model error, which is the difference between the model and the reality. This model error may cause wrong results if the traditional parametric model is used. In order to solve this problem, Semi-parametric model, based on parametric model, is implemented in this article. Semiparametric model introduces a non-parametric component to describe the uncertainties in the observation data and their influences. Both parametric and non-parametric unknowns are solved by penalized least squares. Testing results indicate, that in the existence of observation uncertainties, Semi-parametric model can effectively isolate model error, thereby making it a better approach than parametric model.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huiping Zhu, Li Yan, and Fei Deng "Utilizing semi-parametric model to compensate systematic errors in photogrammetry", Proc. SPIE 7498, MIPPR 2009: Remote Sensing and GIS Data Processing and Other Applications, 74982L (30 October 2009); https://doi.org/10.1117/12.833177
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KEYWORDS
Data modeling

Mathematical modeling

Error analysis

Photogrammetry

Remote sensing

Data processing

Smoothing

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