A statically scanned tandem interferometer

Dominic F. Murphy; Donal A Flavin

doi:10.1117/12.834204

5 October 2009 A statically scanned tandem interferometer

Dominic F. Murphy, Donal A Flavin

Proceedings Volume 7503, 20th International Conference on Optical Fibre Sensors; 75031F (2009) https://doi.org/10.1117/12.834204
Event: 20th International Conference on Optical Fibre Sensors, 2009, Edinburgh, United Kingdom

Abstract

A static tandem Michelson interferometer configuration is reported for remote measurements of group delay change in a thermally modulated, optically dispersive BK7 glass sample. Using a superluminescent diode (SLD) to illuminate the interferometer, low-coherence measurement interferograms with signal-to-noise ratios as low as 16 dB were captured and subsequently processed using dispersive Fourier transform spectrometry (DFTS). Measurements of thermallyinduced delay change were made with < 2 fs root mean square error for optical path delay scans lengths of only 260 μm.

Citation Download Citation

Dominic F. Murphy and Donal A Flavin "A statically scanned tandem interferometer", Proc. SPIE 7503, 20th International Conference on Optical Fibre Sensors, 75031F (5 October 2009); https://doi.org/10.1117/12.834204

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