Paper
31 December 2009 Analysis in wavelength dependence of electronic damage
Author Affiliations +
Abstract
Many investigations in laser induced damage thresholds (LIDT) have shown a very deterministic behavior for the ultra short pulse regime. From the current understanding, femtosecond laser damage is driven by electronic photon-matter interaction. This process can be theoretically described by photo-, and avalanche-ionization and the respective relaxation processes. On the basis of a wavelength dependency of the laser-induced damage threshold of titania, a dominant influence of multi-photon absorption (MPI) on the damage behavior could be demonstrated. This particular characteristic could be observed in a stepwise increase of the LIDT in the transition ranges of the orders of multi-photon absorption. This paper presents an analysis of the wavelength dependence of femtosecond LIDT with different theoretic models and a comparison of simulated data with the measured wavelength dependence of titania. Both, the wavelength position and the quantitative change of the laser power resistance in the range of the n to the n+1 photon absorption are calculated in a theoretical analysis. Additionally, the influence of different microstructures of titania on the quantized MPIcharacteristic is investigated.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Jupé, L. Jensen, K. Starke, D. Ristau, A. Melninkaitis, and V. Sirutkaitis "Analysis in wavelength dependence of electronic damage", Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 75040N (31 December 2009); https://doi.org/10.1117/12.836701
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Cited by 3 scholarly publications.
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KEYWORDS
Ionization

Absorption

Titanium dioxide

Laser induced damage

Silica

Data modeling

Dielectrics

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