Diagnostics tools for subsurface damage characterization of ground silica parts

P. Cormont; J. Neauport; N. Darbois; J. Destribats; C. Ambard; O. Rondeau

doi:10.1117/12.836368

31 December 2009 Diagnostics tools for subsurface damage characterization of ground silica parts

P. Cormont, J. Neauport, N. Darbois, J. Destribats, C. Ambard, O. Rondeau

Proceedings Volume 7504, Laser-Induced Damage in Optical Materials: 2009; 75040Y (2009) https://doi.org/10.1117/12.836368
Event: Laser Damage Symposium XLI: Annual Symposium on Optical Materials for High Power Lasers, 2009, Boulder, Colorado, United States

Abstract

Subsurface cracks in fused silica optics are known to be damage initiators under laser irradiation. Each step of optic production, from sawing to polishing, creates its own type of cracks. An efficient optic manufacturing process requires that each production step removes cracks from the previous step. The extent of cracks has to be measured for each production step. We review and compare different subsurface damage (SSD) characterization techniques applied to ground and fine ground fused silica samples.

Citation Download Citation

P. Cormont, J. Neauport, N. Darbois, J. Destribats, C. Ambard, and O. Rondeau "Diagnostics tools for subsurface damage characterization of ground silica parts", Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 75040Y (31 December 2009); https://doi.org/10.1117/12.836368

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