Paper
31 July 2009 The optical constants of thin films calculated from reflectance and transmittance measurements
Donyau Chiang, Cheng Hung Chu, Hai-Pang Chiang, Ding Ping Tsai
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Proceedings Volume 7505, Optical Data Storage 2009; 750518 (2009) https://doi.org/10.1117/12.839471
Event: Optical Data Storage, 2009, Lake Buena Vista, Florida, United States
Abstract
The optical constants including the refraction index n and extinguished coefficient k of the variety of materials are calculated from their reflection and transmittance measurements with measured wavelengths. We derive the reflectance and transmittance equations associated to the material film optical constants. The organic and inorganic materials used for optical recording medium materials are examined. The organic dyes show that significant optical constants vary with the laser wavelength, in comparison to the inorganic phase-change materials. This is an evidence to indicate the complicated bonding structure in the organic dyes within the measured wavelength ranges.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Donyau Chiang, Cheng Hung Chu, Hai-Pang Chiang, and Ding Ping Tsai "The optical constants of thin films calculated from reflectance and transmittance measurements", Proc. SPIE 7505, Optical Data Storage 2009, 750518 (31 July 2009); https://doi.org/10.1117/12.839471
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Cited by 2 scholarly publications.
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KEYWORDS
Silver

Reflectivity

Transmittance

Solids

Crystals

Diamond

Numerical analysis

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