Paper
25 November 2009 Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)
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Abstract
We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.
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Sucbei Moon, Youngjae Won, and Dug Young Kim "Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)", Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750605 (25 November 2009); https://doi.org/10.1117/12.848242
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KEYWORDS
Luminescence

Analog electronics

Fluorescence lifetime imaging

Photodetectors

Signal detection

Microscopy

Convolution

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