PROCEEDINGS VOLUME 7511
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY | 19-22 OCTOBER 2009
2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
IN THIS VOLUME

5 Sessions, 78 Papers, 0 Presentations
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY
19-22 October 2009
Shanghai, China
Front Matter: Volume 7511
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751101 (4 January 2010); doi: 10.1117/12.846029
Imaging and Spectroscopy
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751102 (20 November 2009); doi: 10.1117/12.836308
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751103 (20 November 2009); doi: 10.1117/12.837853
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751104 (20 November 2009); doi: 10.1117/12.837770
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751105 (20 November 2009); doi: 10.1117/12.837812
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751106 (20 November 2009); doi: 10.1117/12.837771
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751107 (20 November 2009); doi: 10.1117/12.839690
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751108 (20 November 2009); doi: 10.1117/12.837955
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751109 (20 November 2009); doi: 10.1117/12.839861
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110A (20 November 2009); doi: 10.1117/12.840121
Interferometer
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110B (20 November 2009); doi: 10.1117/12.840190
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110C (20 November 2009); doi: 10.1117/12.837952
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110D (20 November 2009); doi: 10.1117/12.835988
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110E (20 November 2009); doi: 10.1117/12.837453
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110F (20 November 2009); doi: 10.1117/12.837519
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110G (20 November 2009); doi: 10.1117/12.838029
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110H (20 November 2009); doi: 10.1117/12.837606
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110I (20 November 2009); doi: 10.1117/12.837776
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110J (20 November 2009); doi: 10.1117/12.837778
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110K (20 November 2009); doi: 10.1117/12.839866
Optoelectric Measurement
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110L (20 November 2009); doi: 10.1117/12.837910
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110M (20 November 2009); doi: 10.1117/12.838276
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110N (20 November 2009); doi: 10.1117/12.837816
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110O (20 November 2009); doi: 10.1117/12.839828
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110P (20 November 2009); doi: 10.1117/12.837919
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110Q (20 November 2009); doi: 10.1117/12.837988
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110R (20 November 2009); doi: 10.1117/12.838050
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110S (20 November 2009); doi: 10.1117/12.838229
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110T (20 November 2009); doi: 10.1117/12.838218
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110U (20 November 2009); doi: 10.1117/12.839991
Poster Session
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110V (20 November 2009); doi: 10.1117/12.835998
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110W (20 November 2009); doi: 10.1117/12.836114
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110Y (20 November 2009); doi: 10.1117/12.837142
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110Z (20 November 2009); doi: 10.1117/12.837317
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751110 (20 November 2009); doi: 10.1117/12.837510
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751111 (20 November 2009); doi: 10.1117/12.837569
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751112 (20 November 2009); doi: 10.1117/12.837570
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751113 (20 November 2009); doi: 10.1117/12.837583
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751114 (20 November 2009); doi: 10.1117/12.837586
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751115 (20 November 2009); doi: 10.1117/12.837650
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751116 (20 November 2009); doi: 10.1117/12.837714
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751117 (20 November 2009); doi: 10.1117/12.837737
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751118 (20 November 2009); doi: 10.1117/12.837739
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751119 (20 November 2009); doi: 10.1117/12.837750
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111A (20 November 2009); doi: 10.1117/12.837791
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111B (20 November 2009); doi: 10.1117/12.837802
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111C (20 November 2009); doi: 10.1117/12.837805
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111D (20 November 2009); doi: 10.1117/12.837820
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111E (20 November 2009); doi: 10.1117/12.837845
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111F (20 November 2009); doi: 10.1117/12.837848
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111G (20 November 2009); doi: 10.1117/12.837858
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111H (20 November 2009); doi: 10.1117/12.837861
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111I (20 November 2009); doi: 10.1117/12.837867
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111J (20 November 2009); doi: 10.1117/12.837887
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111K (20 November 2009); doi: 10.1117/12.837924
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111L (20 November 2009); doi: 10.1117/12.837933
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111M (20 November 2009); doi: 10.1117/12.837951
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111N (20 November 2009); doi: 10.1117/12.837972
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111O (20 November 2009); doi: 10.1117/12.838014
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111P (20 November 2009); doi: 10.1117/12.838015
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111Q (20 November 2009); doi: 10.1117/12.838053
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111R (20 November 2009); doi: 10.1117/12.838054
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111S (20 November 2009); doi: 10.1117/12.838056
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111T (20 November 2009); doi: 10.1117/12.838085
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111U (20 November 2009); doi: 10.1117/12.838098
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111V (20 November 2009); doi: 10.1117/12.838112
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111W (20 November 2009); doi: 10.1117/12.838116
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111X (20 November 2009); doi: 10.1117/12.838123
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111Y (20 November 2009); doi: 10.1117/12.838129
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111Z (20 November 2009); doi: 10.1117/12.838149
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751120 (20 November 2009); doi: 10.1117/12.838182
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751121 (20 November 2009); doi: 10.1117/12.838195
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751122 (20 November 2009); doi: 10.1117/12.838210
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751123 (20 November 2009); doi: 10.1117/12.838220
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751124 (20 November 2009); doi: 10.1117/12.838358
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751125 (20 November 2009); doi: 10.1117/12.839674
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751126 (20 November 2009); doi: 10.1117/12.839934
Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751127 (20 November 2009); doi: 10.1117/12.841075
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