Measurement of surface bidirectional reflectance distribution based on parabolic mirror

Ju Ren; Jian-lin Zhao

doi:10.1117/12.837861

20 November 2009 Measurement of surface bidirectional reflectance distribution based on parabolic mirror

Ju Ren, Jian-lin Zhao

Proceedings Volume 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 75111H (2009) https://doi.org/10.1117/12.837861
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

A novel approach and system based on parabolic mirror is proposed for measuring a surface's bidirectional reflectance distribution function (BRDF) rapidly and accurately. In virtue of a truncated paraboloid with reflecting film on the interior surface, the angular distribution of surface optical reflectance in tri-dimensional space is transformed into a twodimensional planar image, which is collected by a CCD camera and goes though a followed angular mapping and data processing correspondingly, a fast measurement of in plane and out of plane reflectance distribution is realized within a few minutes. Furthermore, the laser beam is reflected by parabolic mirror to irradiate the sample surface in various incidence angles. Primary measurements and analysis of surface reflectance of varied substance along with various machining process are carried out with this system. Results indicates that this novel measurement system, compare with conventional ones, can avoid the measuring errors generated by the fluctuation of laser's power and the sensitivity of the detector, as well as dramatically shorten the acquisition time. In addition, a compact and portable configuration eases the measurement procedure consumedly.

Citation Download Citation

Ju Ren and Jian-lin Zhao "Measurement of surface bidirectional reflectance distribution based on parabolic mirror", Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111H (20 November 2009); https://doi.org/10.1117/12.837861

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available