Accuracy assessment of novel two-axes rotating and single-axis translating calibration equipment

Bo Liu; Dong Ye; Rensheng Che

doi:10.1117/12.838056

20 November 2009 Accuracy assessment of novel two-axes rotating and single-axis translating calibration equipment

Bo Liu, Dong Ye, Rensheng Che

Proceedings Volume 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 75111S (2009) https://doi.org/10.1117/12.838056
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

There is a new method that the rocket nozzle 3D motion is measured by a motion tracking system based on the passive optical markers. However, an important issue is required to resolve-how to assess the accuracy of rocket nozzle motion test. Therefore, calibration equipment is designed and manufactured for generating the truth of nozzle model motion such as translation, angle, velocity, angular velocity, etc. It consists of a base, a lifting platform, a rotary table and a rocket nozzle model with precise geometry size. The nozzle model associated with the markers is installed on the rotary table, which can translate or rotate at the known velocity. The general accuracy of rocket nozzle motion test is evaluated by comparing the truth value with the static and dynamic test data. This paper puts emphasis on accuracy assessment of novel two-axes rotating and single-axis translating calibration equipment. By substituting measured value of the error source into error model, the pointing error reaches less than 0.005deg, rotation center position error reaches 0.08mm, and the rate stability is less than 10^-3. The calibration equipment accuracy is much higher than the accuracy of nozzle motion test system, thus the former can be used to assess and calibrate the later.

Citation Download Citation

Bo Liu, Dong Ye, and Rensheng Che "Accuracy assessment of novel two-axes rotating and single-axis translating calibration equipment", Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75111S (20 November 2009); https://doi.org/10.1117/12.838056

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