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24 November 2009 Spatial phase-shifting moire deflectometry
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Abstract
A novel spatial phase-shifting method is presented from the moire phenomena. With the analysis to moire patterns from the scalar diffraction theory, there is stable phase shift between different order diffraction interferograms of moire deflectometry. This phase shift just depends on the distance between two gratings and the grating period. In this spatial phase-shifting method, no beam splitter, polarizer or wave plate is used and the disadvantage of uncertain phase shifts due to the methods using polarizer or wave plate is removed.
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Yang Song, YunYun Chen, Anzhi He, and Zhimin Zhao "Spatial phase-shifting moire deflectometry", Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751305 (24 November 2009); https://doi.org/10.1117/12.837902
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