Paper
27 January 2010 Fast identification of highly distorted images
Taras Holotyak, Sviatoslav Voloshynovskiy, Fokko Beekhof, Oleksiy Koval
Author Affiliations +
Proceedings Volume 7541, Media Forensics and Security II; 754116 (2010) https://doi.org/10.1117/12.838962
Event: IS&T/SPIE Electronic Imaging, 2010, San Jose, California, United States
Abstract
In this paper, we consider a low complexity identification system for highly distorted images. The performance of the proposed identification system is analyzed based on the average probability of error. An expected improvement of the performance is obtained combining random projection transform and concept of bit reliability. Simulations based on synthetic and real data confirm the efficiency of the proposed approach.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Taras Holotyak, Sviatoslav Voloshynovskiy, Fokko Beekhof, and Oleksiy Koval "Fast identification of highly distorted images", Proc. SPIE 7541, Media Forensics and Security II, 754116 (27 January 2010); https://doi.org/10.1117/12.838962
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
System identification

Reliability

Error analysis

Binary data

Databases

Signal to noise ratio

Computing systems

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