Paper
31 December 2010 Independent distortion correction algorithm for machine vision systems
Tang Wei, Ye Dong
Author Affiliations +
Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 754458 (2010) https://doi.org/10.1117/12.885668
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China
Abstract
An independent distortion correction algorithm based on equidistance is proposed in this paper. Two entirely different procedures of distortion correction and parameter calibration are isolated. Distortion correction is firstly realized to provide the basis for linear calibration to improve calibration accuracy. In the independent algorithm, the difference between ideal and actual pixel coordinates is defined as distortion amounts for all imaging points, which are calculated by finite "reference photopoints", mobile pitches and straight slopes in x and y directions of the feature-point lattice. Then distortion amounts for all non-imaging feature points are computed by making use of bilinear interpolation. Finally, a higher-precision reference table is set up which applies to all kinds of calibration or measurement images. The imaging center point (principal point) is the position with the smallest distortion amount in the reference table. The experimental results demonstrate that the independent algorithm could effectively correct lens distortion and it has benefit for improving the calibration accuracy of machine vision systems.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tang Wei and Ye Dong "Independent distortion correction algorithm for machine vision systems", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754458 (31 December 2010); https://doi.org/10.1117/12.885668
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KEYWORDS
Distortion

Calibration

Cameras

Machine vision

CCD cameras

Imaging systems

3D metrology

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